电子发烧友

silicon wafer used for testing purposes.机械测试晶圆片 - 用于测试的晶圆片。Microroughness - Surface roughness

2011-12-01 14:20

(Conductor)2．4．1线宽(Conductor Width)·导线宽度和间距应满足照相底版(Artwork)或采购文件的尺寸要求。·导线边缘粗糙(Roughness)、缺口(Nicks)、针孔

2012-08-09 21:09