嗨，如何将以下代码转换为提取MAC地址？我已经导入.Net命名空间但不知道如何将块放在一起.http：//msdn.microsoft.com/en-us/library ... dress.aspxThanks！-bOb- 以上来自于谷歌翻译 以下为原文Hi,How do I convert the following code for extracting MAC address to VEE? I have already imported the .Net namespaces but not sure how to put the blocks together.http://msdn.microsoft.com/en-us/library ... dress.aspxThanks!-bOb-
2019-06-21 08:54
LV53L0X有任何设置或镜头可以帮助它应对高环境光吗？ ＃lv53l0x #outside以上来自于谷歌翻译以下为原文 are there any settings or lenses for the LV53L0X to help it cope with high ambiant light? #lv53l0x #outside
2019-03-25 09:34
我正在使用STM8L052r8来测量ADC通道24/25的温度。我正在使用经过验证的ADC例程，但我的预期数量并不正确。 看来我在ADC引脚的输入端有一个电压降/电流流过R1。任何人都可以告诉我，从ADC输入到接地的微电路中存在什么内部电阻，以及我可能期望在那里流动的那种电流。我将ADC引脚配置为浮动输入，并禁用施密特触发器。温度探头连接在THP1和THM1上。 R2是驱动电阻9k09，R2与ADC输入串联1k。 我打赌真的很简单，但我对此很新。提前致谢，理查德以上来自于谷歌翻译以下为原文 I’m using the STM8L052r8 to measure temperatures on the ADC channels 24/25. I’m using a proven ADC routine but my expected counts aren’t coming in correct. It seems I've got a volt drop/ current flow across R1 on the input to the ADC pin.Could anyone tell me what internal resistance there is in the micro from the ADC input to ground please, and the kind of current I can expect to be flowing there.I have the ADC pins configured as input floating, with the Schmitt trigger disabled.The temperature probe is connected across THP1 and THM1. R2 is the drive resistor 9k09, R2 is a 1k in series with the ADC input. Really simple I bet but I'm pretty new to this.Thanks in advance, Richard
2018-11-06 10:28
好的，我看到一些非常奇怪（令人沮丧）的东西。MPLABX 3.65不再显示输出窗口中的任何东西。它似乎悬在那里很长一段时间。它也不再是我的目标了。我用它已经好几个星期了。它工作得很好。突然间，它就停止工作了。我以为这是我正在做的项目，但我试过其他项目，他们也做同样的事情。我试着在V3.60中打开和编译了一个相同的项目（我在升级到3.6之后安装了）。所以，我卸载了V3.65并重新安装了3.65，我也遇到了同样的问题。为什么这些工具易受失败影响？注意，我正在使用XC32网络许可证，服务器正在运行。有人知道这会不会导致输出窗口完全退出什么问题？在购买网络许可证之前，我试图设置优化级别，我会在输出窗口中得到警告。 以上来自于百度翻译 以下为原文 OK, I am seeing something very strange (and frustrating). MPLABX 3.65 no longer shows anything in the output window. It just seems to hang there for a very long time. It no longer programs my target either. I have been using it with no problems for weeks. It was working fine. All of a sudden it just quit working. I thought it was the project I was working on, but I have tried other projects and they do the same thing. AND I tried opened and compiled the same project(s) in v3.60 (which I left installed after upgrading to 3.6.5). So, I uninstalled v3.65 and re-installed 3.65 and I have the same problems. Why are these tools so vulnerable to failure? Note that I am using XC32 network license and the server is up and running. Does anyone know if there could be a problem with that that would cause the output window to quit anything at all? Before I purchased the network license and I tried to set optimization levels, I would get warnings in the output window.
2019-01-23 07:16
大家好日子。这是我的第一篇文章，我非常需要你的帮助。对于我的项目，我想测量DUT的S11和S21。我的DUT是各种薄片材料，大约2x2cm，厚度为0.1cm，夹在两个矩形波导之间。我有2个VNA供我使用。 1. Agilent E5070B 2. Advantest R3767CG。为了仅测量DUT（不包括波导）的S11和S21，我需要将测量平面移动到器件平面。如附图所示。我在谷歌上做了很多阅读，谷歌搜索的结果并不详细和令人满意，或者它们对我的理解太过提前了。根据Rohde＆amp; Sons的应用报告。 Schwarz关于“介电材料特性的测量”，这可以通过调整电气长度或使用大多数vna中存在的去嵌入功能来完成。我无法在我的两个vna的手册中找到关于“去嵌入”功能的任何内容，但我发现我有电子延迟功能。可悲的是，我不知道如何计算所需的延迟。如何计算所需的电气长度校正以排除波导的影响？请帮助我，任何帮助将深表感谢。 以上来自于谷歌翻译 以下为原文Good day to everyone. This is my first post and i greatly need your help. For my project, i would like to measure the S11 and S21 of a DUT. my DUT, are various thin pieces of material, approximately 2x2cm, and 0.1cm thick will be sandwich between two rectangular waveguides. i have 2 VNA at my disposal.1. Agilent E5070B2. Advantest R3767CG. In order to measure the S11 and S21 of ONLY the DUT (excluding the waveguides) i need to shift the measurement plane to the device plane. as shown in the attached picture. I've done lots of reading in google, and the googled results are not detail and satisfactory, or maybe they are too advance for my understanding. According to an application note by Rohde& Schwarz on "measurement of dielectric material propertiess", this can be done by-adjusting the electrical length or-using the de-embedding function present in most vna. I cant find anything about "de-embedding" feature in the manual of my both vna, but i found out that i have the electrical delay function. Sadly, i have no idea how to calculate the delay required. How can i calculate the required electrical length correction to exclude the effects of the waveguides? Please help me, any help will be deeply appreciated.附件untitled.PNG21.5 KB
2019-10-16 10:36
您好，我试着编辑一个反网络堆栈的一部分，不使用Maloc，因为它总是失败。代码使用MALOC创建对象并插入到链表中。在下面的代码片段中，我已经注释出了MALOC。我的计划是创建结构体的本地实例并将其插入到列表中。我可以把2个项目插入到我的列表中，当试图添加第三时，列表没有被正确地终止，我输入了无限的while循环。有人知道为什么我的名单没有被正确地终止吗？此代码简单地将元素添加到列表中，整个代码随后将一些变量设置为默认值。 以上来自于百度翻译 以下为原文 Hello, I am trying to edit part of a backnet stack to not use malloc as it always fails. The code uses malloc to create an object and insert into a linked list. In the following code snippet I have commented out the malloc. My plan is to create a local instance of the struct and insert that into my list. I am able to insert 2 items into my list, when trying to add the third, the list is not properly terminated and I enter an infinite while loop. Can anyone see why my list is not properly terminated? CHobjects* newNode(instance, channel, name, description){CHobjects *node;CHobjects newNode; node=CHobjects; while(node!=NULL) {if(node->instance==instance) return node=node->next; } if(strlen((char *)objectName)>objectNameMax || strlen((char *)description)>descriptionMax)goto cc8; //fail name or description is too long// if((node=(CHobject *)malloc(sizeof(CHobject)))==NULL) //get a block of space for this object's info// goto cc8; //fail if we can't get space for it test.next=CHobjects; //link on to list CHobjects=&test; CHcount++;} This code simply adds the elements to the list, the whole code would afterwards set some variables to default values.
2019-02-12 13:38
你好！在我的最后一个项目中，我使用了2个PIC18处理器。首先通过UART1连接到PC，通过UART2连接到第二个处理器。我能够用MCC生成的引导加载程序将新的固件引导到第一个PIC。我需要用第二个PIC做同样的事情。我尝试使用第一个处理器作为桥（什么）。在UART1上收到，我把它发送到UART2，在UART2上接收到的东西，我把它发送到UART1），并引导第二个处理器。但是进程进入“编程闪存”阶段，然后停止，没有编程。有人有类似的经历吗？谢谢您！ 以上来自于百度翻译 以下为原文 Hello!In my last project I use 2 PIC18 processors.First is connected to PC via UART1 and to the second processor via UART2.I am able to bootload new firmware to the first PIC using MCC generated bootloader.I need to do the same thing with the second PIC.I tried to use the first processor as bridge (what is received on UART1 I send it to UART2 and what is received on UART2 I send it to UART1) and to bootload the second processor.But process goes up to "Programming flash" stage, then stops and nothing is programmed.I wonder is it possible at all?!Does somebody have some similar experience? Thank you!
2019-02-18 12:06
任何人都可以了解HP8753D网络分析仪的测量不确定度规范;上个月，我们公司租用了HP8753D网络分析仪，配有HP85032B校准套件，用于测量我们产品的反射参数性能。在查看该分析仪的性能规格时（使用带N型连接的指定校准套件），反射测量不确定度在S11幅度= 1时表示为0.02。这是从技术规格手册第4页复制的，并以红色圈出附件。这似乎是一个非常大的不确定性，特别是在阻抗方面：S11 = 0.999相当于100k欧姆S11 = 0.979相当于4k7欧姆这个0.02 S11幅度不确定性相当于阻抗的96％不确定性？当然，在实践中，这两个单元都非常准确地测量了它们。我们是否错误地解释了这些规范？任何帮助表示赞赏。先谢谢你，乔希 以上来自于谷歌翻译 以下为原文Can anyone shed some light on the measurement uncertainty specifications for a HP8753D Network analyser; Last month our company rented a HP8753D Network analyser complete with HP85032B calibration kit to measure the reflection parameter performance of our product. When looking at the performance specifications for this analyser (using the specified cal kit with N type connections) the reflection measurement uncertainty is stated as 0.02 for S11 magnitude = 1. This is copied from the technical specifications manual page 4, andcircled in red in the attached file. This seems be a very large uncertainty, particularly in terms of impedance: S11=0.999 equates to 100k Ohms S11=0.979 equates to 4k7 Ohms This 0.02 S11 magnitude uncertainty equates to a 96% uncertainty in impedance? In practice of course, both are measured very accurately by this unit. Have we interpreted these specifications wrongly? Any help is appreciated. Thanks in advance, Josh附件HP8735D Measurement Uncertainty.png63.1 KB
2019-04-28 10:28
年轻时的Art Fong 最近在翻阅HP的历史的时候，在timeling里边发现了一位看起来像华人的Art Fong，我被他的成就所震撼，原来HP最早的射频测试仪器几乎都是他研发的，在HP别人也称他为“Mr. Microwave”。
2019-08-27 08:19
PIC18F26K80@ 64 MHz（16MHz晶体+4XPLL）、MPLAB X、XC8等。得到一致的测量，良好的可重复性等，但我也有一段时间的这个问题，有点忽略它，我想我会回到它的一天。今天的那一天！正常运行，ANX引脚测量电容正好，我得到预期的ADC读数。一个范围示出了一个很好的线性电荷累积在电容上，接着在测量之间的放电路径被启用时，电荷进入接地。但是如果我把ANX端子短路到地上，我就从ADC中得到0xFFF（满刻度）。范围显示引脚绝对在地上，所以“真实世界”是零伏特。但出于某种原因，ADC返回满比例。我正在运行ADC单端，参考电源轨，都非常正常。我看不到CTMU体系结构中会导致这种情况的任何东西。有什么想法吗？谢谢！ 以上来自于百度翻译 以下为原文 PIC18F26K80 @ 64MHz (16MHz crystal + 4xPLL), MPLAB X, XC8, etc. etc. I've had the CTMU + ADC working pretty well for a while now. Getting consistent measurements, good repeatability, etc. But I've also had this problem for a while, sort of ignored it figuring I'd come back to it someday. Today's that day! Operating normally, the ANx pin measures capacitance just fine and I get the expected readings from the ADC. A scope shows a nice linear charge accumulating on the capacitance, followed by the charge going to ground when the discharge path is enabled between measurements. But if I short the ANx terminal to ground, I get 0xFFF (full scale) out of the ADC. The scope shows the pin is definitely at ground, so the "real world" is zero volts. But for some reason the ADC returns full scale. I'm running the ADC single ended, referenced to the supply rails, all very normal. I can't see anything in the CTMU architecture that would cause this. Any ideas? Thanks!
2019-04-23 11:51
