电子发烧友

Introduction This application note presents the results of nanomechanical tests in which an Agilent Nano Indenter G200 was used to measure the force and displacement while crushing single ceramic particles. Two type

2010-08-16 15:27

Introduction This application note presents the results of nanomechanical tests in which an Agilent Nano Indenter G200 was used to measure the Young’s modulus and hardness of three sol-gel coatings. The same instr

2010-08-13 10:29

Characterization of Microstrip Meanders in PCB Interconnects Meandering traces are often used

2009-03-24 13:03

Thermal Characterization of Packaged Semiconductor Devices:With the continuing industry trends

2009-11-29 17:16

of mechanical properties on the scale of nanometers. Instrumented indentation facilitates such testing, because the

2010-08-16 14:43

Introduction This application note presents a brief study of the mechanical properties of red blood

2010-08-16 15:25

Characterization fo Cdv_dt Induced Power Loss in Synchronous Buck DC-DC Converters:Synchronous buck

2009-11-28 15:41