Introduction Atomic Force Microscopy (AFM) is a powerful, non-destructive technique that can
2010-08-11 09:12
; Atomic-resolution imaging of a small sample area using AFM or STM scanners• Allows simple point-and-shoot
2010-08-09 10:40
Nanotechnology focuses on low-cost, high-throughput, directed synthesis of structures and devices at the nanoscale in order to address the requirements of a variety of applications. Microelectronics, for instance, offer
2010-08-04 13:54
什么是AFM AFM為1986 年由STM發明人之一Binnig,美丹佛大學Quate 及IBM的Gerber 所發明。AFM 是一種類似於STM 的顯微技術，它的許多元件和STM
2009-03-10 08:48
使用示波器优化AFM图像Atomic Force Microscopy (AFM) can be simply used as a surfacecharacterization technique
2009-12-15 15:22
Take the interference-imaging spectrometer for example, the paper analyses the characters
2009-09-02 10:41
用于AFM成像数据表的5500 LS AFM/SPM平台电动大平台
2019-10-11 14:15
In-cell及On-cell的概念、原理、难点及技术实现。
2012-02-06 11:18
SummaryHigh resolution atomic forcemicroscopy (AFM) can be per-formed simultaneously with optical
2010-08-03 12:55
AFM8
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