Characterization of Microstrip Meanders in PCB Interconnects Meandering traces are often used
2009-03-24 13:03
Characterization of Microstrip Meanders in PCB Interconnects
2009-03-27 15:44
Embedded Microstrip Impedance Formula:Every so often questions about the formula for the impedance
2010-01-15 10:14
per second data rates are creating signalintegrity problems for printed circuit board structures such asbackplanes, microstrip tr
2010-07-11 17:42
Thermal Characterization of Packaged Semiconductor Devices:With the continuing industry trends
2009-11-29 17:16
Most of us have been using incorrect values for the propagation speed of our microstrip traces
2010-01-15 10:25
Characterization fo Cdv_dt Induced Power Loss in Synchronous Buck DC-DC Converters:Synchronous buck
2009-11-28 15:41
Introduction This application note presents the results of nanomechanical tests in which an Agilent Nano Indenter G200 was used to measure the Young’s modulus and hardness of three sol-gel coatings. The same instr
2010-08-13 10:29
Introduction This application note presents the results of nanomechanical tests in which an Agilent Nano Indenter G200 was used to measure the force and displacement while crushing single ceramic particles. Two type
2010-08-16 15:27
Vector network analyzer (VNA) calibrations have historically been very laborintensive. That story has changed with the release of Agilent’s new series ofElectronic Calibration Modules (ECal). ECal modules offer calibrations at a
2010-07-21 20:13
