OverviewThe Agilent 5400 SPM/AFM is a high-precision instrument engineered to provid
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用于AFM成像数据表的5500 LS AFM/SPM平台电动大平台
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Features and Benefits • Scientifi c-grade instrument delivers atomic resolution • New design provides improved performance • New electronics and techniques offer high-resolution KFM/EFM
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Overview Agilent’s 5500/5100 inverted light micro-scope (ILM) system combines the power of a
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Features and Benefits• Highly modular system affords utmost fl exibility• Unrivaled environmental and temperature control• Superior scanning in fl uids, gases, or ambient conditions
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Features and Benefits•High-performance atomic forcemicroscope designed for multi-ple-user labs and educationalenvironments•Cost-effective, modular solutionoffers easy upgrade path•Single multip
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conditions, includingextremely harsh conditions•Full compatibility with Agilent’smodular AFM/SPM micr
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; Atomic-resolution imaging of a small sample area using AFM or STM scanners• Allows simple point-and-shoot AFM i
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什么是AFM AFM為1986 年由STM發明人之一Binnig,美丹佛大學Quate 及IBM的Gerber 所發明。AFM 是一種類似於STM 的顯微技術,它的許多元件和STM
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Notices© Agilent Technologies, Inc. 2004No part of this manual may be reproduced in any form
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